Hui Liu - Identification Of Structural Damage Location Using Impedance Sensors: Validation Of Wireless Sensor System
Brand: Hui Liu -
EAN:
9783846593622MPN: m03846593621
Kategorie: Bücher & Zeitschriften
Binding : Taschenbuch, Label : LAP LAMBERT Academic Publishing, Publisher : LAP LAMBERT Academic Publishing, medium : Taschenbuch, numberOfPages : 176, publicationDate : 2011-11-21, authors : Hui Liu, Yaowen Yang, Annamdas, Venu Gopal Madhav, ISBN : 3846593621
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