Indranil Chatterjee - Single Event Upset In Dual- And Triple-well Srams: Radiation-induced Charge Collection Mechanisms In Sub-90nm Dual- And Triple-well Cmos Srams
Brand: Indranil Chatterjee -
EAN:
9783659123658MPN: m0365912365x
Kategorie: Bücher & Zeitschriften
Brand : LAP Lambert Academic Publishing, Binding : Taschenbuch, Label : LAP LAMBERT Academic Publishing, Publisher : LAP LAMBERT Academic Publishing, medium : Taschenbuch, numberOfPages : 96, publicationDate : 2012-07-06, authors : Indranil Chatterjee, ISBN : 365912365X
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